Direct measurement of the binding force between microfabricated particles and a planar surface in aqueous solution by force-sensing piezoresistive cantilevers

Langmuir

Volumn 21, Issue 24, 2005, Pages 11251-11261

  Onoe, Hiroaki ^a   Gel, Murat ^b   Hoshino, Kazunori ^a   Matsumoto, Kiyoshi ^a   Shimoyama, Isao ^a  

^a UNIVERSITY OF TOKYO   (Japan)

^b INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION FORCE; BINDING FORCES; PIEZORESISTIVE CANTILEVERS;

ADHESION; ASPECT RATIO; CANTILEVER BEAMS; PH EFFECTS; SELF ASSEMBLY; SILICA; VAN DER WAALS FORCES;

FLUID MECHANICS;

EID: 28844436310     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la051666f     Document Type: Article

References (40)

1. Talghader, J.; Tu, J.; Smith, J. IEEE Photonics Technol. Lett. 1995, 7, 1321-1323.
2. Jacobs, H.; Tao, A.; Schwartz, A.; Gracias, D.; Whitesides, G. Science 2002, 296, 323-325.
3. Xiong, X.; Hanein, Y.; Fang, J.; Wang, Y.; Wang, W.; Schwartz, D.; Böhringer, K. J. Microelectromech. Syst. 2003, 12, 117-127.
4. Srinivasan, U.; Liepmann, D.; Howe, R. J. Microelectromech. Syst. 2001, 10, 17-24.
5. Gracias, D.; Tien, J.; Breen, T.; Hsu, C.; Whitesides, G. Science 2000, 289, 1170-1172.
6. Breen, T.; Tien, J.; Oliver, S.; Hadzic, T.; Whitesides, G. Science 1999, 284, 948-951.
7. Onoe, H.; Matsumoto, K.; Shimoyama, I. J. Microelectromech. Syst. 2004, 13, 603-611.
8. Onoe, H.; Matsumoto, K.; Shimoyama, I. Proceedings of the 17th Micro Electro Mechanical Systems; Maastricht, 2004.
9. Nakakubo, T.; Shimoyama, I. Sens. Actuators, A. 2000, 83, 161-166.
10. McNally, H.; Pingle, M.; Lee, S.; Beregstrom, D.; Bashir, R. Appl. Surf. Sci. 2003, 214, 109-119.
11. Binning, G.; Quate, C.; Gerber, C. Phys. Rev. Lett. 1986, 56, 930-933.
12. Israelachvili, J.; Adams, G. J. Chem. Soc., Faraday Trans. 1 1978, 74, 975-1001.
13. Hoh, J.; Cleveland, J.; Prater, C.; Revel, J.; Hansma, P. J. Am. Chem. Soc. 1992, 114, 4917-4918.
14. Weisenhorn, A.; Hansma, P.; Albercht, T.; Quate, C. Appl. Phys. Lett. 1989, 54, 2651-2653.
15. Tsukruk, V.; Bliznyuk, V. Langmuir 1998, 14, 446-455.
16. Dicke, C.; Hahner, G. J. Am. Chem. Soc. 2002, 124, 12619-12625.
17. Ducker, W.; Senden, T.; Pashley, R. Nature 1991, 353, 239-241.
18. Ducker, W.; Senden, T.; Pashley, R. Langmuir 1992, 8, 1831-1836.
19. Butt, H.; Jachke, M.; Ducker, W. Bioelectrochem. Bioenerg. 1995, 38, 191-201.
20. Kappl. M.; Butt, H. Part. Part. Syst. Charact. 2002, 19, 129-143.
21. Li, Y.; Tao, N.; Pan, J.; Gracia, A.; Lindsay, S. Langmuir 1993, 9, 637-641.
22. Vezenov, D.; Noy, A.; Rozsnyai, L.; Lieber, C. J. Am. Chem. Soc. 1997, 119, 2006-2015.
23. Clear, S.; Nealey, P. J. Colloid Interface Sci. 1999, 273, 238-250.
24. Israelachvili, J. Proc. Natl. Acad. Sci. U.S.A. 1987, 84, 4722-4724.
25. Horn, R.; Smith, D.; Haller, W. Chem. Phys. Lett. 1989, 162, 404-408.
26. Grabbe, A.; Horn, R. J. Colloid Interface Sci. 1993, 157, 375-383.
27. Shubin, V.; Kekicheff, P. J. Colloid Interface Sci. 1993, 155, 108-123.
28. Chapel, J. Langmuir 1994, 10, 4237-4243.
29. Atkins, D.; Kékicheff, P.; Spalla, O. J. Colloid Interface Sci. 1997, 188, 234-237.
30. Gel, M.; Shimoyama, I. J. Micromech. Microeng. 2004, 14, 423-428.
31. Verwey, E.; Overbeek, J. In Theory of the Stability of Lyophobic Colloids; Elsevier: Amsterdam, 1948.
32. Tortonese, M.; Barrett, R.; Quate, C.Appl. Phys. Lett. 1993, 62, 834-836.
33. Nishimura, S.; Tateyama, H.; Tsunematsu, K.; Jinnai, K. J. Colloid Interface Sci. 1992, 152, 359-367.
34. Ruths, M.; Alcantar, N.; Israelachvili, J. J. Phys. Chem. B 2003, 107, 11149-11157.
35. Brewer, N.; Beake, B.; Leggett, G. Langmuir 2001, 17, 1970-1974.
36. Ruths, M. Langmuir 2003, 19, 6788-6795.
37. Bernam, A.; Drummond, C.; Israelachivili, J. Tribol. Lett. 1998, 4, 95-101.
38. Whitesides, G.; Ostuni, E.; Takayama, S.; Jiang, X.; Ingber, D. Annu. Rev. Biomed. Eng. 2001, 3, 335-373.
39. Tsukruk, V. Adv. Mater. 2001, 13, 95-108.
40. Miki, N.; Zhang, X.; Khanna, R.; Ayon, A.; Ward, D.; Spearing, S. Sens. Actuators, A 2003, 103, 194-201.