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Volumn , Issue , 2004, Pages 420-425

Resistance characterization of Au bump and anisotropic conductive adhesives under temperature and moisture conditions

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; MOISTURE;

EID: 28444456396     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (23)
  • 2
    • 0033352029 scopus 로고    scopus 로고
    • The contact resistance and reliability of Anisotropically Conductive Film (ACF)
    • Yim, M.J. et al, "The Contact Resistance and Reliability of Anisotropically Conductive Film (ACF)", IEEE Trans Advanced Packaging, Vol.22, No.2, 1999, pp. 166-173.
    • (1999) IEEE Trans Advanced Packaging , vol.22 , Issue.2 , pp. 166-173
    • Yim, M.J.1
  • 4
    • 0036890948 scopus 로고    scopus 로고
    • Anisotropic conductive film flip chip joining using thin chips
    • Jokinen, E. et al, "Anisotropic Conductive Film Flip Chip Joining Using Thin Chips", Microelectronics Reliability, Vol. 42, 2002, pp.1913-1920.
    • (2002) Microelectronics Reliability , vol.42 , pp. 1913-1920
    • Jokinen, E.1
  • 5
    • 0042371331 scopus 로고    scopus 로고
    • Reliability of anisotropically conductive adhesive joints on a flip chip/FR-4 substrate
    • Liu, J. et al, "Reliability of Anisotropically Conductive Adhesive joints on a Flip Chip/FR-4 Substrate", ASME J. Electronic Packaging, Vol.124, 2002, pp.240-245.
    • (2002) ASME J. Electronic Packaging , vol.124 , pp. 240-245
    • Liu, J.1
  • 7
    • 2342622580 scopus 로고    scopus 로고
    • Recent advances of interconnection technologies using anisotropic conductive films
    • Watanabe, I. et al, "Recent Advances of Interconnection Technologies Using Anisotropic Conductive Films", Proc. International IEEE Conference on Asian Green Electronics, 2004, pp.239-234.
    • (2004) Proc. International IEEE Conference on Asian Green Electronics , pp. 239-1234
    • Watanabe, I.1
  • 11
    • 0030212322 scopus 로고    scopus 로고
    • Anisotropically conductive adhesive flip-chip bonding on rigid and flexible printed circuit substrates
    • Lai, Z. et al, "Anisotropically Conductive Adhesive Flip-Chip Bonding on Rigid and Flexible Printed Circuit Substrates", IEEE Trans CPMT-B, Vol.19, No.3, 1996, pp.644-660.
    • (1996) IEEE Trans CPMT-B , vol.19 , Issue.3 , pp. 644-660
    • Lai, Z.1
  • 12
    • 0032094229 scopus 로고    scopus 로고
    • Conduction mechanism in anisotropic conductive adhesive assembly
    • Oguibe, C.N. et al, "Conduction Mechanism in Anisotropic Conductive Adhesive Assembly", IEEE Trans CPMT-A, Vol.21, No.2, 1998, pp.235-242.
    • (1998) IEEE Trans CPMT-A , vol.21 , Issue.2 , pp. 235-242
    • Oguibe, C.N.1
  • 14
    • 0142165077 scopus 로고    scopus 로고
    • Failure mechanism study of Anisotropic Conductive Film (ACF) packages
    • Lei, L.M. et al, "Failure Mechanism Study of Anisotropic Conductive Film (ACF) Packages", IEEE Trans CPT, Vol.26, No.3, 2003, pp.509-516.
    • (2003) IEEE Trans CPT , vol.26 , Issue.3 , pp. 509-516
    • Lei, L.M.1
  • 15
    • 2442442805 scopus 로고    scopus 로고
    • Failure mechnism of anisotropic conductive adhesive interconnections in flip chip ICs on flexible subtrates
    • de Vries, J. et al, "Failure Mechnism of Anisotropic Conductive Adhesive Interconnections in Flip Chip ICs on Flexible Subtrates", IEEE Trans CPT, Vol.27, No.1, 2004, pp. 161-166.
    • (2004) IEEE Trans CPT , vol.27 , Issue.1 , pp. 161-166
    • De Vries, J.1
  • 17
    • 10444242532 scopus 로고    scopus 로고
    • Towards a predictive behavior of non-conductive adhesive interconnects in moisture environment
    • Caers, J.F.J.M. et al, "Towards a Predictive Behavior of Non-Conductive Adhesive Interconnects in Moisture Environment", Proc. 54th Electronic Components & Technology Conference, 2004, pp. 106-112.
    • (2004) Proc. 54th Electronic Components & Technology Conference , pp. 106-112
    • Caers, J.F.J.M.1
  • 19
    • 33845593296 scopus 로고    scopus 로고
    • JEDEC Standard, JESD22-A104-B, July
    • JEDEC Standard, JESD22-A104-B, Temperature Cycling, July 2003.
    • (2003) Temperature Cycling
  • 22
    • 0030288469 scopus 로고    scopus 로고
    • On the failure mechanism of anisotropically conductive adhesive joints on copper metallization
    • Liu, J. "On the Failure Mechanism of Anisotropically Conductive Adhesive Joints on Copper Metallization", International Journal on Adhesion and Adhesives, Vol.16, 1996. pp.285-287.
    • (1996) International Journal on Adhesion and Adhesives , vol.16 , pp. 285-287
    • Liu, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.