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Volumn , Issue , 2003, Pages 369-375

Resistance characterization of flip chip joint formed using Au bumps and anisotropic conductive adhesives

Author keywords

[No Author keywords available]

Indexed keywords

ADHESIVE JOINTS; ADHESIVES; ANISOTROPY; CHIP SCALE PACKAGES; CONDUCTIVE FILMS; CONTACT RESISTANCE; ELECTRONICS PACKAGING; FILLERS; FLIP CHIP DEVICES; GLASS BONDING; ITO GLASS; TIN OXIDES;

EID: 84954038734     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EPTC.2003.1271548     Document Type: Conference Paper
Times cited : (12)

References (10)
  • 3
    • 0037215760 scopus 로고    scopus 로고
    • Contact Resistance of Metal-coated Polymer Particles used in Anisotropically Conductive Adhesives
    • Jarmo Maattanen, "Contact Resistance of Metal-coated Polymer Particles used in Anisotropically Conductive Adhesives", Soldering and Surface mount Technology, 15/1 [2003] Pg 12-15
    • (2003) Soldering and Surface Mount Technology , vol.15 , Issue.1 , pp. 12-15
    • Maattanen, J.1
  • 4
    • 0036681696 scopus 로고    scopus 로고
    • Effect of Bonding Parameters on the Reliability Performance of Anisotropic Conductive Adhesive Interconnects for Flip Chip on Flex Packages Assembly - I. Different Bonding Temperature
    • Y. C. Chan, and D. Y. Luk, "Effect of Bonding Parameters on the Reliability Performance of Anisotropic Conductive Adhesive Interconnects for Flip Chip on Flex Packages Assembly - I. Different Bonding Temperature", Microelectronic Reliability 42 (2002) Pg 1185-1194
    • (2002) Microelectronic Reliability , vol.42 , pp. 1185-1194
    • Chan, Y.C.1    Luk, D.Y.2
  • 5
    • 0036681534 scopus 로고    scopus 로고
    • Effect of Bonding Parameters on the Reliability Performance of Anisotropic Conductive Adhesive Interconnects for Flip Chip on Flex Packages Assembly - II. Different Bonding Pressure
    • Y. C. Chan, and D. Y. Luk, "Effect of Bonding Parameters on the Reliability Performance of Anisotropic Conductive Adhesive Interconnects for Flip Chip on Flex Packages Assembly - II. Different Bonding Pressure", Microelectronic Reliability 42 (2002) Pg 1195-1204
    • (2002) Microelectronic Reliability , vol.42 , pp. 1195-1204
    • Chan, Y.C.1    Luk, D.Y.2
  • 7
    • 0042371331 scopus 로고    scopus 로고
    • Reliability of Anisotropically Conductive Adhesive Joints on Flip Chip / FR4 Substrate
    • September
    • Johan Liu and Zhonghe Lai, "Reliability of Anisotropically Conductive Adhesive Joints on Flip Chip / FR4 Substrate", ASME Transactions on Advances in Electronic Packaging, Vol.124, September 2002
    • (2002) ASME Transactions on Advances in Electronic Packaging , vol.124
    • Liu, J.1    Lai, Z.2
  • 8
    • 0034276193 scopus 로고    scopus 로고
    • Reliability Investigations on Conductive Adhesive Joints with Emphasis on Mechanics of the Conduction Mechanism
    • September
    • Rainer Dudek, harry Berek, Thomas Fritsch, and Bernd Michel, "Reliability Investigations on Conductive Adhesive Joints with Emphasis on Mechanics of the Conduction Mechanism", IEEE Transactions on Componenets and Packaging Technologies, Vol.23, No.3, September 2000
    • (2000) IEEE Transactions on Componenets and Packaging Technologies , vol.23 , Issue.3
    • Dudek, R.1    Berek, H.2    Fritsch, T.3    Michel, B.4
  • 10
    • 0033352029 scopus 로고    scopus 로고
    • The Contact Resistance and Reliability of Anisotropically Conductive Film (ACF)
    • May
    • Myung-Jin Yim and Kyung-Wook Paik, "The Contact Resistance and Reliability of Anisotropically Conductive Film (ACF)", IEEE Transactions on Advanced Packaging, Vol.22, No.2, May 1999
    • (1999) IEEE Transactions on Advanced Packaging , vol.22 , Issue.2
    • Yim, M.-J.1    Paik, K.-W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.