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Volumn 87, Issue 15, 2005, Pages 1-3

Modeling of heterogeneous precipitation of iron in silicon

Author keywords

[No Author keywords available]

Indexed keywords

PRECIPITATION (CHEMICAL); SILICON; THERMAL EFFECTS;

EID: 28344449653     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2099531     Document Type: Article
Times cited : (18)

References (19)
  • 4
    • 0001167668 scopus 로고    scopus 로고
    • edited by H.Huff, U.Gösele, and H.Tsuya (The Electrochemical Society, Pennington, New Jersey
    • T. Y. Tan, R. Gafiteanu, S. M. Joshi, and U. Gösele, in Semiconductor Silicon 1998, edited by, H. Huff, U. Gösele, and, H. Tsuya, (The Electrochemical Society, Pennington, New Jersey, 1998), p. 1050.
    • (1998) Semiconductor Silicon 1998 , pp. 1050
    • Tan, T.Y.1    Gafiteanu, R.2    Joshi, S.M.3    Gösele, U.4
  • 9
    • 28344452131 scopus 로고
    • Proceedings of the Satellite Symposium to ESSDERC 93 Grenoble, France, edited by B. O.Kolbesen, C.Claeys, P.Stallhofer, and F.Tardif (The Electrochemical Society, Pennington, New Jersey
    • R. Falster, in Crystalline Defects and Contamination: Their Impact and Control in Device Manufacturing, Proceedings of the Satellite Symposium to ESSDERC 93 Grenoble, France, edited by, B. O. Kolbesen, C. Claeys, P. Stallhofer, and, F. Tardif, (The Electrochemical Society, Pennington, New Jersey, 1993), pp. 149-169.
    • (1993) Crystalline Defects and Contamination: Their Impact and Control in Device Manufacturing , pp. 149-169
    • Falster, R.1
  • 10
    • 17144385859 scopus 로고    scopus 로고
    • Proceedings of The Electrochemical Society Fall 2004 Meeting Honolulu, Hawaii, edited by C. L.Claeys, M.Watanabe, R.Falster, and P.Stallhofer (The Electrochemical Society, Pennington, New Jersey
    • H. Väinölä, A. Haarahiltunen, M. Yli-Koski, E. Saarnilehto, and J. Sinkkonen, in High Purity Silicon VIII, Proceedings of The Electrochemical Society Fall 2004 Meeting Honolulu, Hawaii, edited by, C. L. Claeys, M. Watanabe, R. Falster, and, P. Stallhofer, (The Electrochemical Society, Pennington, New Jersey, 2004), pp. 160-164.
    • (2004) High Purity Silicon VIII , pp. 160-164
    • Väinölä, H.1    Haarahiltunen, A.2    Yli-Koski, M.3    Saarnilehto, E.4    Sinkkonen, J.5
  • 11
    • 17144426089 scopus 로고    scopus 로고
    • Proceedings of The Electrochemical Society Fall 2004 Meeting Honolulu, Hawaii, edited by C. L.Claeys, M.Watanabe, R.Falster, and P.Stallhofer (The Electrochemical Society, Pennington, New Jersey
    • A. Haarahiltunen, H. Väinölä, M. Yli-Koski, E. Saarnilehto, and J. Sinkkonen, in High-Purity Silicon VIII, Proceedings of The Electrochemical Society Fall 2004 Meeting Honolulu, Hawaii, edited by, C. L. Claeys, M. Watanabe, R. Falster, and, P. Stallhofer, (The Electrochemical Society, Pennington, New Jersey, 2004), pp. 135-145.
    • (2004) High-Purity Silicon VIII , pp. 135-145
    • Haarahiltunen, A.1    Väinölä, H.2    Yli-Koski, M.3    Saarnilehto, E.4    Sinkkonen, J.5
  • 13
    • 28344451397 scopus 로고    scopus 로고
    • M.S. thesis, Helsinki University of Technology
    • M. Palokangas, M.S. thesis, Helsinki University of Technology, 2002.
    • (2002)
    • Palokangas, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.