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Volumn 174, Issue 1-4, 1997, Pages 163-169

A model for oxygen precipitation in Czochralski silicon during crystal growth

Author keywords

Czochralski growth; Mathematical model; Nucleation; Oxygen; Precipitation; Silicon

Indexed keywords

CRYSTAL GROWTH FROM MELT; MATHEMATICAL MODELS; NUCLEATION; OXYGEN; POINT DEFECTS; PRECIPITATION (CHEMICAL);

EID: 0031547227     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(96)01099-8     Document Type: Article
Times cited : (21)

References (16)
  • 12
    • 0002585097 scopus 로고
    • Eds. H.R. Huff, R.J. Kriegler and Y. Takeishiin The Electrochemical Society, Pennington
    • R.A. Craven, in: Semiconductor Silicon 1981, Eds. H.R. Huff, R.J. Kriegler and Y. Takeishiin (The Electrochemical Society, Pennington, 1981) p. 254.
    • (1981) Semiconductor Silicon 1981 , pp. 254
    • Craven, R.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.