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Volumn 2001-January, Issue , 2001, Pages 217-222

Power trends and performance characterization of 3-Dimensional integration for future technology generations

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POWER UTILIZATION; INTEGRATED CIRCUIT INTERCONNECTS; INTEGRATION; STOCHASTIC MODELS; STOCHASTIC SYSTEMS; THREE DIMENSIONAL INTEGRATED CIRCUITS;

EID: 28344439387     PISSN: 19483287     EISSN: 19483295     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2001.915230     Document Type: Conference Paper
Times cited : (11)

References (12)
  • 3
    • 0025445666 scopus 로고
    • Three dimensional stacked MOS transistors by localized silicon epitaxial overgrowth
    • R. Zingg, J. A. Friedrich, G. W. Neudeck, and B. Hofflinger, "Three Dimensional Stacked MOS Transistors by Localized Silicon Epitaxial Overgrowth", IEEE Transactions on Electron Devices, Vol. 37, No. 6, pp. 1452-1461, 1990.
    • (1990) IEEE Transactions on Electron Devices , vol.37 , Issue.6 , pp. 1452-1461
    • Zingg, R.1    Friedrich, J.A.2    Neudeck, G.W.3    Hofflinger, B.4
  • 4
  • 6
    • 0031270573 scopus 로고    scopus 로고
    • Three dimensional metalization for vertically integrated circuits
    • P. Ramm, D. Bollman, R. Braun, R. Buchner, et al, "Three Dimensional Metalization for Vertically Integrated Circuits", Microelectronic Engineering, 37/38, pp. 39-47, 1997.
    • (1997) Microelectronic Engineering , vol.37-38 , pp. 39-47
    • Ramm, P.1    Bollman, D.2    Braun, R.3    Buchner, R.4
  • 12
    • 0032026510 scopus 로고    scopus 로고
    • A stochastic wire-length distribution for gigascale integration (GSI) - Part 1: Derivation and validation
    • Mar.
    • J. A. Davis, V. K. De, and J. Meindl, "A Stochastic Wire-Length Distribution for Gigascale Integration (GSI) - Part 1: Derivation and Validation", IEEE Trans. Electron Devices, Vol. 45, No. 3, pp. 580-589, Mar. 1998.
    • (1998) IEEE Trans. Electron Devices , vol.45 , Issue.3 , pp. 580-589
    • Davis, J.A.1    De, V.K.2    Meindl, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.