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Volumn 494, Issue 1-2, 2006, Pages 18-22

Characterization of an Ar/O2 magnetron sputtering plasma using a Langmuir probe and an energy resolved mass spectrometer

Author keywords

Cathode poisoning; Langmuir probe; Magnetron sputtering

Indexed keywords

ARGON; CARRIER CONCENTRATION; CHARACTERIZATION; LANGMUIR BLODGETT FILMS; MAGNETRON SPUTTERING; MASS SPECTROMETRY;

EID: 27944486113     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.07.154     Document Type: Conference Paper
Times cited : (6)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.