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Volumn 494, Issue 1-2, 2006, Pages 18-22
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Characterization of an Ar/O2 magnetron sputtering plasma using a Langmuir probe and an energy resolved mass spectrometer
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Author keywords
Cathode poisoning; Langmuir probe; Magnetron sputtering
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Indexed keywords
ARGON;
CARRIER CONCENTRATION;
CHARACTERIZATION;
LANGMUIR BLODGETT FILMS;
MAGNETRON SPUTTERING;
MASS SPECTROMETRY;
CATHODE POISONING;
ION DENSITY;
LANGMUIR PROBE;
PLASMAS;
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EID: 27944486113
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2005.07.154 Document Type: Conference Paper |
Times cited : (6)
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References (21)
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