메뉴 건너뛰기




Volumn 96, Issue 2-3, 1997, Pages 359-363

The structure of Cu-Al films prepared by unbalanced DC magnetron sputtering

Author keywords

Control of grain size; Magnetron sputtering; Nanostructured films

Indexed keywords

AMORPHOUS FILMS; FILM PREPARATION; GRAIN SIZE AND SHAPE; ION BOMBARDMENT; MAGNETRON SPUTTERING; NANOSTRUCTURED MATERIALS; SPUTTER DEPOSITION; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 0031275864     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(97)00357-5     Document Type: Article
Times cited : (9)

References (15)
  • 8
    • 0040633531 scopus 로고
    • S.M. Rossnagel, J.J. Cuomo, W.D. Westwood (Eds.), Noyes, NJ
    • D.M. Mattox, in: S.M. Rossnagel, J.J. Cuomo, W.D. Westwood (Eds.), Handbook of Plasma Processing Technology, Noyes, NJ, 1990, p. 344.
    • (1990) Handbook of Plasma Processing Technology , pp. 344
    • Mattox, D.M.1
  • 14
    • 0043059758 scopus 로고
    • J.M. Farley, R.W. Nichols (Eds.), Pergamon, Oxford
    • J. Zeman, S. Role, J. Skarek, in: J.M. Farley, R.W. Nichols (Eds.), Non-Destructive Testing, vol. 3, Pergamon, Oxford, 1988, p. 1963.
    • (1988) Non-destructive Testing , vol.3 , pp. 1963
    • Zeman, J.1    Role, S.2    Skarek, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.