Low-cost testing of 5 GHz low noise amplifiers using new RF BIST circuit

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 21, Issue 6, 2005, Pages 571-581

  Ryu, Jee Youl ^a   Kim, Bruce C ^b,c  

^a Samsung SDI   (South Korea)

^b UNIVERSITY OF ALABAMA   (United States)

^c IEEE   (United States)

Author keywords

Built in self test; Low noise amplifier; Output DC voltage; RFIC

Indexed keywords

BUILT-IN-SELF TEST; LOW NOISE AMPLIFIER; OUTPUT DC VOLTAGE; RFIC;

COMPUTER SIMULATION; DIFFERENTIAL EQUATIONS; ELECTRIC IMPEDANCE; RADIO SYSTEMS; SIGNAL DETECTION; TESTING; VOLTAGE MEASUREMENT;

AMPLIFIERS (ELECTRONIC);

EID: 27844516545     PISSN: 09238174     EISSN: 15730727     Source Type: Journal    
DOI: 10.1007/s10836-005-3735-y     Document Type: Conference Paper

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