Challenges and approaches in mixed signal RF testing

Proceedings of the Annual IEEE International ASIC Conference and Exhibit

Volumn , Issue , 1997, Pages 33-37

  Soma, Mani ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; COMPUTER SIMULATION; SIGNAL PROCESSING;

MIXED SIGNAL RADIOFREQUENCY TESTING;

INTEGRATED CIRCUIT TESTING;

EID: 0030650384     PISSN: 10630988     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)