SCOPUS 정보 검색 플랫폼

Proceedings - IEEE International SOC Conference

Volumn , Issue , 2004, Pages 324-327

A new design for built-in self-test of 5GHz low noise amplifiers

a Arizona State University (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; COMPUTER SIMULATION; ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; ELECTRONIC EQUIPMENT TESTING; MICROELECTRONICS; NATURAL FREQUENCIES; OPTIMIZATION; POWER AMPLIFIERS; SIGNAL TO NOISE RATIO; SPURIOUS SIGNAL NOISE; TRANSCEIVERS; VOLTAGE MEASUREMENT;

LOW NOISE AMPLIFIERS (LNA); NOISE FIGURE; SYSTEM-ON-CHIP (SOC); VOLTAGE GAIN;

BUILT-IN SELF TEST;

EID: 14844336923 PISSN: None EISSN: None Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper

Times cited : (11)

References (10)

1
- 14844307399
- A new BIST scheme for 5GHz low noise amplifiers
- May
- th European Test Symposium, Vol. 9, pp. 228-233, May 2004.
- (2004) th European Test Symposium , vol.9 , pp. 228-233
- Ryu, J.-Y.¹ Kim, B.C.² Sylla, I.³

2
- 84893749534
- RF-BIST: Loopback spectral signature analysis
- March
- D. Lupea, U. Pursche and H. -J. Jentschel, "RF-BIST: Loopback Spectral Signature Analysis," IEEE Proceedings of the 2003 DATE Conference and Exhibition, pp. 478-483, March 2003.
- (2003) IEEE Proceedings of the 2003 DATE Conference and Exhibition , pp. 478-483
- Lupea, D.¹ Pursche, U.² Jentschel, H.J.³

3
- 84971282302
- BiST model for IC RF-transceiver front-end
- November
- th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, pp. 295-302, November 2003.
- (2003) th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems , pp. 295-302
- Dabrowski, J.¹

4
- 84893746200
- A signature test framework for rapid production testing of RF circuits
- March
- R. Voorakaranam, S. Cherubal and A. Chatterjee, "A Signature Test Framework for Rapid Production Testing of RF Circuits," Proceedings of the 2002 Design, Automation and Test in Europe Conference and Exhibition, pp. 186-191, March 2003.
- (2003) Proceedings of the 2002 Design, Automation and Test in Europe Conference and Exhibition , pp. 186-191
- Voorakaranam, R.¹ Cherubal, S.² Chatterjee, A.³

5
- 0029543052
- A built-in self-test strategy for wireless communication systems
- October
- B. R. Veillette and G. W. Roberts, "A Built-in Self-Test Strategy for Wireless Communication Systems," Proceedings of the 1995 International Test Conference, pp. 930-939, October 1995.
- (1995) Proceedings of the 1995 International Test Conference , pp. 930-939
- Veillette, B.R.¹ Roberts, G.W.²

6
- 0030650384
- Challenges and approaches in mixed signal RF testing
- M. Soma, "Challenges and Approaches in Mixed Signal RF Testing," IEEE Proceedings, pp. 33-37, 1997.
- (1997) IEEE Proceedings , pp. 33-37
- Soma, M.¹

7
- 0003936046
- Prentice Hall, New Jersey
- nd Edition: Prentice Hall, New Jersey, 1997, pp. 212-293.
- (1997) nd Edition , pp. 212-293
- Gonzalez, G.¹

8
- 0029220349
- Low-power monolithic RF peak detector analysis
- January
- R. G. Meyer, "Low-Power Monolithic RF Peak Detector Analysis," IEEE J. of Solid-State Circuits, vol. 30, no. 1, pp. 65-67, January 1995.
- (1995) IEEE J. of Solid-state Circuits , vol.30 , Issue.1 , pp. 65-67
- Meyer, R.G.¹

9
- 0003417349
- John Wiley & Sons, Inc., New York, chapter 2, 3 and 7
- th Edition, John Wiley & Sons, Inc., New York, 2001, chapter 2, 3 and 7.
- (2001) th Edition
- Gray¹ Hurst² Lewis³ Meyer⁴

10
- 0004200915
- Prentice Hall, New Jersey
- B. Razavi, RF Microelectronics: Prentice Hall, New Jersey, 1998, pp. 11-53.
- (1998) RF Microelectronics , pp. 11-53
- Razavi, B.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.