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Volumn 1, Issue , 2003, Pages 155-160

Spectral signature analysis-BIST for RF front-ends

Author keywords

[No Author keywords available]

Indexed keywords

BUILDING BLOCKES; MULTICARRIER SIGNAL; RF FRONT END; SELF-CORRECTION; SELF-TEST; SPECTRAL SIGNATURE; SYSTEM LEVELS; TRANSMITTER AND RECEIVER;

EID: 15844392348     PISSN: 16849965     EISSN: 16849973     Source Type: Journal    
DOI: 10.5194/ars-1-155-2003     Document Type: Article
Times cited : (9)

References (11)
  • 1
    • 0003906701 scopus 로고    scopus 로고
    • Essentials of electronic testing for digital
    • Boston a.o Kluwer Acad. Publ. 2nd Ed
    • Bushnell, M. L. and Agrawal, V. D.: Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits, Boston a.o., Kluwer Acad. Publ. 2nd Ed. 2001.
    • (2001) Memory and Mixed-Signal VLSI Circuits
    • Bushnell, M.L.1    Agrawal, V.D.2
  • 2
    • 0141463223 scopus 로고
    • DSP-based testing of analog and mixed-signal circuits Washington DC
    • Mahoney, M.: DSP-Based Testing of Analog and Mixed-Signal Circuits, Washington DC, IEEE Computer Soc. Pr. 1987.
    • (1987) IEEE Computer Soc. Pr
    • Mahoney, M.1
  • 7
    • 0034482667 scopus 로고    scopus 로고
    • Stand-alone integrated test core for time and frequency domain measurements
    • Hafed, M., Abaskharoun, N., and Roberts, G. W.: A Stand-Alone Integrated Test Core for Time and Frequency Domain Measurements, Proc. of the International Test Conference (ITC 2000), Atlantic City, NJ. 3-5 Oct 2000, pp. 1031-1040, 2000. (Pubitemid 32134760)
    • (2000) IEEE International Test Conference (TC) , pp. 1031-1040
    • Hafed Mohamed1    Abaskharoun Nazmy2    Roberts Gordon, W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.