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Volumn 242, Issue 13, 2005, Pages 2581-2586

Use of wafer temperature determination for the study of unintentional parameter influences for the MOVPE of III-nitrides

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EID: 27844451017     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssb.200541099     Document Type: Conference Paper
Times cited : (7)

References (17)
  • 8
    • 0004944073 scopus 로고
    • Berlin, Dec., Gesammelte Abhandlungen (Barth, Leipzig)
    • G. Kirchhoff, Mber. Akad. Wiss. Berlin, Dec. 1859, in: Gesammelte Abhandlungen (Barth, Leipzig, 1882), p. 566.
    • (1859) Mber. Akad. Wiss. , pp. 566
    • Kirchhoff, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.