A technique for automated validation of fault tolerant designs using Laser Fault Injection (LFI)

Digest of Papers - 28th Annual International Symposium on Fault-Tolerant Computing, FTCS 1998

Volumn 1998-January, Issue , 1998, Pages 162-167

  Samson, John R ^a   Moreno, Wilfrido ^b   Falquez, Fernando ^a  

^a Honeywell Space Systems Clearwater   (United States)

^b UNIVERSITY OF SOUTH FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION PROGRAMS; AUTOMATION; FAULT TOLERANCE; FLIP FLOP CIRCUITS; INTEGRATED CIRCUIT DESIGN; METAL WORKING; MICROELECTRONICS; REDUCED INSTRUCTION SET COMPUTING; SOFTWARE TESTING; VLSI CIRCUITS;

AUTOMATED TESTING; CIRCUIT STRUCTURES; CONCURRENT ERROR DETECTION; FAULT TOLERANT DESIGN; INSTRUCTION RETRY; LASER FAULT INJECTIONS; LOW COST TESTING; SINGLE BOARD COMPUTERS;

FAULT TOLERANT COMPUTER SYSTEMS;

EID: 45749126925     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/FTCS.1998.689466     Document Type: Conference Paper

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