Recent materials characterizations of [2D] and [3D] thin film ferroelectric structures

Journal of the American Ceramic Society

Volumn 88, Issue 7, 2005, Pages 1691-1701

  Scott, J F ^a   Morrison, F D ^a   Miyake, M ^a   Zubko, P ^a   Lou, Xiaojie ^a   Kugler, V M ^a   Rios, S ^a   Zhang, Ming ^a   Tatsuta, T ^b   Tsuji, O ^b   Leedham, T J ^c  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b 33 Tanakamiya cho Takeda F   (Japan)

^c Epichem Oxides and Nitrides   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM TITANATE; CERAMIC MATERIALS; CRYOGENICS; MATHEMATICAL MODELS; NANOTUBES; PEROVSKITE; PHASE TRANSITIONS; SINGLE CRYSTALS; THERMAL EFFECTS; THIN FILMS; THREE DIMENSIONAL; TWO DIMENSIONAL;

AMORPHOUS STATES; CRYOGENIC TEMPERATURES; FINITE SIZE EFFECTS; GRADIENT DEFECT MODELS;

FERROELECTRIC MATERIALS;

EID: 27644501560     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2005.00486.x     Document Type: Review

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