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Volumn 301, Issue , 2004, Pages 67-70

Elementary events of ferroelectrics switching using atomic force microscope

Author keywords

Atomic force microscopy; Domain walls; Ferroelectric domains; Switching

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC BREAKDOWN; ELECTRIC FIELDS; FERROELECTRIC MATERIALS;

EID: 13244250184     PISSN: 00150193     EISSN: 15635112     Source Type: Conference Proceeding    
DOI: 10.1080/00150190490454909     Document Type: Article
Times cited : (8)

References (15)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.