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Volumn 4, Issue 2, 2003, Pages 114-122

Ferroelectric nanotubes

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BARIUM TITANATE; DEPOSITION; DYNAMIC RANDOM ACCESS STORAGE; FERROELECTRIC MATERIALS; LEAD COMPOUNDS; SCANNING ELECTRON MICROSCOPY; SECOND HARMONIC GENERATION; STRONTIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; WETTING; X RAY DIFFRACTION ANALYSIS;

EID: 4944230204     PISSN: 16065131     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (98)

References (31)
  • 1
    • 4944239885 scopus 로고
    • Piezoelectric ink-jet printer sleeves
    • K. Herzog and E. Kattner (Siemens AG.) (12 March)
    • Piezoelectric ink-jet printer sleeves: K. Herzog and E. Kattner (Siemens AG.) // US Patent Number 4504845 (12 March 1985).
    • (1985) US Patent Number 4504845
  • 2
    • 4944223186 scopus 로고    scopus 로고
    • Ferroelectric ink-jet printers
    • S. Sakamaki, M. Aizawa, M. Toki, Y. Yamada and Y. Takahashi (15 Nov)
    • Ferroelectric ink-jet printers: S. Sakamaki, M. Aizawa, M. Toki, Y. Yamada and Y. Takahashi // US Patent Number 20010412 (15 Nov 2001).
    • (2001) US Patent Number 20010412
  • 3
    • 4944227555 scopus 로고    scopus 로고
    • Tunable photonics with ferroelectrics
    • J. Sajeev and K. Busch (20 June)
    • Tunable photonics with ferroelectrics: J. Sajeev and K. Busch // US Patent Number US2002074537 (20 June 2002).
    • (2002) US Patent Number US2002074537
  • 4
    • 4944241867 scopus 로고    scopus 로고
    • Deep trenching of DRAMs with ferroelectric capacitors
    • B. Gnade, P. Kirlin, and S. Summerfelt (Texas Inst.) (7 March)
    • Deep trenching of DRAMs with ferroelectric capacitors: B. Gnade, P. Kirlin, and S. Summerfelt (Texas Inst.) // US Patent Number US6033919 (7 March 2000).
    • (2000) US Patent Number US6033919
  • 11
    • 4944266053 scopus 로고    scopus 로고
    • Infineon Corp. (private communication)
    • Infineon Corp. (private communication).
  • 12
    • 4844231948 scopus 로고    scopus 로고
    • Tatsuya Shimoda (private communication)
    • Tatsuya Shimoda (private communication).
  • 22
    • 0037076965 scopus 로고    scopus 로고
    • M. Steinhart et al. // Science 296 (2002) 1997.
    • (2002) Science , vol.296 , pp. 1997
    • Steinhart, M.1
  • 26
    • 4944230776 scopus 로고    scopus 로고
    • This high temperature treatment allows converting of the amorphous layer into the perovskite ferroelectric phase and releasing defects and residual stress after etching process
    • This high temperature treatment allows converting of the amorphous layer into the perovskite ferroelectric phase and releasing defects and residual stress after etching process.
  • 28
    • 4944257210 scopus 로고    scopus 로고
    • An atomic force microscope provided with a conductive tip and a lock-in detection system is used to measure the piezoelectric vibrations generated by the sample itself via converse piezoelectric effect by applying an ac voltage across the sample
    • An atomic force microscope provided with a conductive tip and a lock-in detection system is used to measure the piezoelectric vibrations generated by the sample itself via converse piezoelectric effect by applying an ac voltage across the sample.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.