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Volumn 15, Issue 11, 2005, Pages 2130-2135

Deep fused silica wet etching using an Au-free and stress-reduced sputter-deposited Cr hard mask

Author keywords

[No Author keywords available]

Indexed keywords

COMPRESSIVE STRESS; DEFECTS; FUSED SILICA; MASKS; PRESSURE EFFECTS; SPUTTER DEPOSITION; TENSILE STRESS;

EID: 27144446665     PISSN: 09601317     EISSN: None     Source Type: Journal    
DOI: 10.1088/0960-1317/15/11/019     Document Type: Article
Times cited : (19)

References (29)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.