A Bayesian approach to obtain a lower bound for the C pm capability index

Quality and Reliability Engineering International

Volumn 21, Issue 6, 2005, Pages 655-668

  Lin, G H ^a   Pearn, W L ^b   Yang, Y S ^b,c  

^a NATIONAL PENGHU UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^b NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^c DA YEH UNIVERSITY   (Taiwan)

Author keywords

Asymmetric tolerances; Process capability index

Indexed keywords

ASYMMETRIC TOLERANCES; BAYESIAN APPROACH; PROCESS CAPABILITY INDEX; TAGUCHI CAPABILITY INDEX;

ERROR ANALYSIS; QUALITY ASSURANCE; SAMPLING; STATISTICAL METHODS;

INDUSTRIAL MANAGEMENT;

EID: 26644466102     PISSN: 07488017     EISSN: None     Source Type: Journal    
DOI: 10.1002/qre.681     Document Type: Article

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