Distributional and inferential properties of the process accuracy and process precision indices

Communications in Statistics - Theory and Methods

Volumn 27, Issue 4, 1998, Pages 985-1000

  Pearn, W L ^a   Lin, G H ^a   Chen, K S ^b  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b NATIONAL CHIN YI UNIVERSITY OF TECHNOLOGY   (Taiwan)

Author keywords

Process accuracy index; Process mean; Process precision index; Process standard deviation; Process yield

Indexed keywords

EID: 0001673836     PISSN: 03610926     EISSN: None     Source Type: Journal    
DOI: 10.1080/03610929808832139     Document Type: Article

References (5)

1. Arnold, S. F. (1990). Mathematical Statistics. Prentice Hall.
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3. Kane, V. E. (1986). Process capability indices, Journal of Quality Technology, 18, (1), 41-52.
4. Leone, F. C., Nelson, L. S. and Nattingham, R. B. (1961). The folded normal distribution, Technometrics, 3, (4), 543-550.
5. Pearn, W. L., Kotz, S. and Johnson, N. L. (1992). Distributional and inferential properties of process capability indices, Journal of Quality Technology, 24, (4), 216-233.