Computer program for calculating the p-value in testing process capability index Cpmk

Quality and Reliability Engineering International

Volumn 18, Issue 4, 2002, Pages 333-342

  Pearn, W L ^a   Lin, P C ^b  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b NATIONAL CHIN YI UNIVERSITY OF TECHNOLOGY   (Taiwan)

Author keywords

Critical value; p value; Process capability index; Testing hypothesis

Indexed keywords

COMPUTER PROGRAM LISTINGS; PERFORMANCE; QUALITY ASSURANCE; RELIABILITY;

MAPLE COMPUTER PROGRAM; PROCESS CAPABILITY INDEX; PROCESS POTENTIAL; SUPERSTRUCTURE;

PROCESS ENGINEERING;

EID: 0036638471     PISSN: 07488017     EISSN: None     Source Type: Journal    
DOI: 10.1002/qre.465     Document Type: Article

References (6)

1. Distributional and inferential properties of process capability indices
2. A unified approach to capability indices
3. pmk
4. A superstructure of capability indices: Distributional properties and implications
5. Distribution and moments in simplified form for a general class of capability indices
6. Practical implementation of the process capability indices