Assessment of a capability index sensitive to skewness

Quality and Reliability Engineering International

Volumn 17, Issue 4, 2001, Pages 233-241

  Nahar, P C ^a   Hubele, N F ^b   Zimmer, L S ^b  

^a DELPHI CORPORATION   (United States)

^b AZ 85281   (United States)

Author keywords

Bias; Form tolerance; Gamma distribution; Process capability index; Rayleigh distribution; Skewed distributions; Wright's capability index

Indexed keywords

PROCESS CAPABILITY INDEX;

PROBABILITY DISTRIBUTIONS; PROCESS CONTROL; QUALITY ASSURANCE;

RELIABILITY THEORY;

EID: 0035388658     PISSN: 07488017     EISSN: None     Source Type: Journal    
DOI: 10.1002/qre.395     Document Type: Article

References (18)

1. The development of a process capability index for non-normal processes naturally bounded at zero
2. Process capability indices and non-normal distributions
3. Estimation of process capability index for concentricity
4. Transforming non-normal data to normality in statistical process control
5. Process capability calculations for non-normal distributions
6. pk equivalencies
7. pm
8. A process capability index with reliable confidence intervals
9. An application of non-normal process capability indices
10. Computing process capability indices for non-normal data: A review and comparative study
11. A process capability index sensitive to skewness
12. Distributional and inferential properties of process capability indices
13. s on skewed distributions
14. A unified approach to capability indices