A fraction defective based capability index

Quality and Reliability Engineering International

Volumn 17, Issue 6, 2001, Pages 447-458

  Borges, Wagner de Souza ^a   Ho, Linda Lee ^a  

^a UNIVERSITY OF SÃO PAULO   (Brazil)

Author keywords

Bayesian inference; Non normal process; Process capability index

Indexed keywords

BAYESIAN INFERENCE; FRACTION DEFECTIVE; PROCESS CAPABILITY INDEX;

INDUSTRIAL APPLICATIONS; INFERENCE ENGINES; NORMAL DISTRIBUTION; STATISTICAL PROCESS CONTROL;

PROCESS ENGINEERING;

EID: 0035518452     PISSN: 07488017     EISSN: None     Source Type: Journal    
DOI: 10.1002/qre.438     Document Type: Article

References (15)

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