On the distribution of the estimated process yield index Spk

Quality and Reliability Engineering International

Volumn 18, Issue 2, 2002, Pages 111-116

  Wisnowski, James W ^a   Simpson, James R ^a,c   Montgomery, Douglas C ^b  

^a UNITED STATES AIR FORCE ACADEMY   (United States)

^b FLORIDA STATE UNIVERSITY   (United States)

^c Arizona State University   (United States)

Author keywords

Central limit theorem; Illustrative example; Normal distribution

Indexed keywords

APPROXIMATION THEORY; FUNCTIONS; NORMAL DISTRIBUTION; RELIABILITY; STATISTICAL METHODS;

ASYMPTOTIC DISTRIBUTION;

QUALITY ASSURANCE;

EID: 0036494246     PISSN: 07488017     EISSN: None     Source Type: Journal    
DOI: 10.1002/qre.450     Document Type: Article

References (4)

1. Process capability indices
2. Distributional and inferential properties of process capability indices
3. Distributional and inferential properties of the process accuracy and process precision indices
4. Process capability with asymmetric tolerances