Statistical analysis of process capability indices with measurement errors

Quality and Reliability Engineering International

Volumn 18, Issue 4, 2002, Pages 321-332

  Bordignon, Silvano ^a,b   Scagliarini, Michele ^b  

^a UNIVERSITY OF PADOVA   (Italy)

^b UNIVERSITY OF BOLOGNA   (Italy)

Author keywords

Cp; Cpk; Measurement errors; Process capability indices; Statistical properties of PCIs estimators

Indexed keywords

MEASUREMENT ERRORS; PERFORMANCE; PROCESSING; QUALITY ASSURANCE; SAMPLING; STATISTICAL METHODS;

PROCESS CAPABILITY INDICES; PROCESS POTENTIAL;

PROCESS ENGINEERING;

EID: 0036638460     PISSN: 07488017     EISSN: None     Source Type: Journal    
DOI: 10.1002/qre.464     Document Type: Article

References (13)

1. How reliable is your capability index?
2. On the asymptotic distributions of some process capability indices
3. On the distributions of the estimated process capability indices
4. Lower confidence limits on process capability indices
5. pk: Part 1
6. pk: Part 2
7. pk: Part 3
8. pk: Part 4
9. Process capability indices
10. Measurement error effects on the performance of process capability indices