Process capability indices for skewed populations

Quality and Reliability Engineering International

Volumn 18, Issue 5, 2002, Pages 383-393

  Chang, Young Soon ^a   Choi, In Su ^b   Bai, Do Sun ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b EMBRAIN   (South Korea)

Author keywords

Process capability index; Skewed population; Weighted standard deviation

Indexed keywords

COMPUTER SIMULATION; MONTE CARLO METHODS; PRINTED CIRCUIT BOARDS; QUALITY CONTROL;

PROCESS CAPABILITY INDEX (PCI);

STATISTICAL PROCESS CONTROL;

EID: 0036750183     PISSN: 07488017     EISSN: None     Source Type: Journal    
DOI: 10.1002/qre.489     Document Type: Article

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