Optical beam injection methods as a tool for analysis of semiconductor structures

Optica Applicata

Volumn 35, Issue 1, 2005, Pages 129-137

  Domaradzki, Jarosław ^a   Kaczmarek, Danuta ^a  

^a WROCLAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Heterojunction; Induced current; Optical beam; p i n diode; Transparent semiconducting oxide

Indexed keywords

HETEROJUNCTIONS; OXIDES; PHOTOCURRENTS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS; SILICON;

INDUCED CURRENT; OPTICAL BEAM; P-I-N DIODE; TRANSPARENT SEMICONDUCTING OXIDE;

OPTICAL PROPERTIES;

EID: 26644460211     PISSN: 00785466     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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