Detectors of optical and nuclear radiation examined by the Light Beam Induced Current (LBIC) method

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5064, Issue , 2003, Pages 275-280

  Domaradzki, J ^a   Kaczmarek, D ^a   Wegrzecki M ^b   Wegrzecka I ^b   Budzynski T ^b   Krzeminski S ^b   Grabiec, P ^b  

^a WROCLAW UNIVERSITY OF TECHNOLOGY   (Poland)

^b ukasiewicz Research Network Institute of Microelectronics and Photonics   (Poland)

Author keywords

Detector; Induced current; Light beam; Nuclear radiation

Indexed keywords

CAPACITANCE; DIODES; PARTICLE DETECTORS; RADIATION DETECTORS; THRESHOLD VOLTAGE;

LIGHT BEAM INDUCED CURRENT; NUCLEAR RADIATION; OPTICAL RADIATION;

PHOTOCURRENTS;

EID: 0042125255     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.501536     Document Type: Conference Paper

References (4)

1. Acciarri M., Binetti S., Garavaglia M., Pizzini S., Detection of junction failures and other defects in silicon and III-V devices using the LBIC technique in lateral configuration, Elsevier, Materials Science & Engineering B, vol 42, no. 1-3, 1996, pp.208-212
2. Bajaj J., Tennant W. E., Irvine S. J. C., Zucca R., Spatially resolved characterization of HgCdTe materials and devices by scanning laser microscopy, Seminond. Sci. technol., vol. 8, 1993, pp. 872-887
3. Fynn K. A., Bajaj J., Faraone L., A discrete element model of laser beam induced current (LBIC) due to the lateral photovoltaic effect in open circuit HgCdTe photodiodes, IEEE Transaction on Electron Devices, vol. 42, no. 10, 1995, pp. 1775-1782
4. Domaradzki J., Kaczmarek D., Systems of digital data acquisition and processing in the diagnostics of semiconductors, Proceedings of the 14th International Conference of Systems Science, vol. 3, 2001, pp. 259-266