Correspondence among PL measurement, MBIC measurement and defect delineation in polycrystalline cast-Si solar cells

Solar Energy Materials and Solar Cells

Volumn 48, Issue 1-4, 1997, Pages 85-91

  Shimokawa, Ryuichi ^a   Tajima, Michio ^b   Warashina, Masatoshi ^b   Kashiwagi, Yusaku ^a,c   Kawanami, Hitoshi ^a  

^a ELECTROTECHNICAL LABORATORY   (Japan)

^b JAPAN AEROSPACE EXPLORATION AGENCY   (Japan)

^c Tonen Corp Res and Devmt Lab ^*  (Japan)

Author keywords

LBIC measurement; Photoluminescence; Polycrystalline Si; Solar cells

Indexed keywords

CRYSTAL DEFECTS; ELECTRIC CURRENT MEASUREMENT; INDUCED CURRENTS; PHOTOLUMINESCENCE; POLYCRYSTALLINE MATERIALS; SINGLE CRYSTALS;

MONOCHROMATIC LIGHT BEAM INDUCED CURRENT (MBIC) MEASUREMENT;

SILICON SOLAR CELLS;

EID: 0031272365     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(97)00073-1     Document Type: Article

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