-
1
-
-
0012272966
-
-
Kagan, C. R.; Afzali, A.; Martel, R.; Gignac, L. M.; Solomon, P. M.; Schrott, A. G.; Ek, B. Nano Lett. 2003, 3, 119-124.
-
(2003)
Nano Lett.
, vol.3
, pp. 119-124
-
-
Kagan, C.R.1
Afzali, A.2
Martel, R.3
Gignac, L.M.4
Solomon, P.M.5
Schrott, A.G.6
Ek, B.7
-
2
-
-
0012316871
-
-
Lee, J.-O.; Lientschnig, G.; Wiertz, F.; Struijk, M.; Janssen, R. A. J.; Egberink, R.; Reinhoudt, D. N.; Hadley, P.; Dekker, C. Nano Lett. 2003, 3, 113-117.
-
(2003)
Nano Lett.
, vol.3
, pp. 113-117
-
-
Lee, J.-O.1
Lientschnig, G.2
Wiertz, F.3
Struijk, M.4
Janssen, R.A.J.5
Egberink, R.6
Reinhoudt, D.N.7
Hadley, P.8
Dekker, C.9
-
3
-
-
0033575366
-
-
Collier, C. P.; Wong, E. W.; Belohradsky, M.; Raymo, F. M.; Stoddart, J. F.; Kuekes, P. J.; Williams, R. S.; Heath, J. R. Science 1999, 285, 391-394.
-
(1999)
Science
, vol.285
, pp. 391-394
-
-
Collier, C.P.1
Wong, E.W.2
Belohradsky, M.3
Raymo, F.M.4
Stoddart, J.F.5
Kuekes, P.J.6
Williams, R.S.7
Heath, J.R.8
-
4
-
-
0142209388
-
-
Service, R. F. Science 2003, 302, 556-559.
-
(2003)
Science
, vol.302
, pp. 556-559
-
-
Service, R.F.1
-
5
-
-
0037133054
-
-
retracted
-
(a) Schön, J. H.; Meng, H.; Bao, Z. Adv. Mater. 2002, 14, 323-326 (retracted),
-
(2002)
Adv. Mater.
, vol.14
, pp. 323-326
-
-
Schön, J.H.1
Meng, H.2
Bao, Z.3
-
6
-
-
0035909264
-
-
retracted
-
(b) Schön, J. H. Nature 2001, 413, 713-716 (retracted).
-
(2001)
Nature
, vol.413
, pp. 713-716
-
-
Schön, J.H.1
-
8
-
-
0042322640
-
-
(a) Xu, B.; Tao, N. J. Science 2003, 301, 1221-1223.
-
(2003)
Science
, vol.301
, pp. 1221-1223
-
-
Xu, B.1
Tao, N.J.2
-
10
-
-
0141754156
-
-
Nazin, G. V.; Qiu, X. H.; Ho, W. Science 2003, 302, 77-81.
-
(2003)
Science
, vol.302
, pp. 77-81
-
-
Nazin, G.V.1
Qiu, X.H.2
Ho, W.3
-
13
-
-
0037194939
-
-
(a) Cui, X. D.; Primak, A.; Zarate, X.; Tomfohr, J.; Sankey, O. F.; Moore, A. L.; Moore, T. A.; Gust, D.; Nagahara, L. A.; Lindsay, S. M. J. Phys. Chem. B 2002, 106, 8609-8614.
-
(2002)
J. Phys. Chem. B
, vol.106
, pp. 8609-8614
-
-
Cui, X.D.1
Primak, A.2
Zarate, X.3
Tomfohr, J.4
Sankey, O.F.5
Moore, A.L.6
Moore, T.A.7
Gust, D.8
Nagahara, L.A.9
Lindsay, S.M.10
-
14
-
-
0035913978
-
-
(b) Cui, X. D.; Primak, A.; Zarate, X.; Tonfohr, J.; Sankey, O. F.; Moore, A. L.; Moore, T. A.; Gust, D.; Harris, G.; Lindsay, S. M. Science 2001, 294, 571-574.
-
(2001)
Science
, vol.294
, pp. 571-574
-
-
Cui, X.D.1
Primak, A.2
Zarate, X.3
Tonfohr, J.4
Sankey, O.F.5
Moore, A.L.6
Moore, T.A.7
Gust, D.8
Harris, G.9
Lindsay, S.M.10
-
15
-
-
0037774840
-
-
Ramachandran, G. K.; Tomfohr, J. K.; Li, J.; Sankey, O. F.; Zarate, X.; Primak, A.; Terazono, Y.; Moore, T. A.; Moore, A. L.; Gust, D.; Nagahara, L. A.; Lindsay, S. M. J. Phys. Chem. B 2003, 107, 6162-6169.
-
(2003)
J. Phys. Chem. B
, vol.107
, pp. 6162-6169
-
-
Ramachandran, G.K.1
Tomfohr, J.K.2
Li, J.3
Sankey, O.F.4
Zarate, X.5
Primak, A.6
Terazono, Y.7
Moore, T.A.8
Moore, A.L.9
Gust, D.10
Nagahara, L.A.11
Lindsay, S.M.12
-
16
-
-
0141629832
-
-
Kushmerick, J. G.; Naciri, J.; Yang, J. C.; Shashidar, R. Nano Lett. 2003, 3, 897-900.
-
(2003)
Nano Lett.
, vol.3
, pp. 897-900
-
-
Kushmerick, J.G.1
Naciri, J.2
Yang, J.C.3
Shashidar, R.4
-
17
-
-
0032097027
-
-
(a) Ohgi, T.; Sheng, H.-Y.; Nejoh, H. Appl. Surf. Sci. 1998, 130-132, 919-924.
-
(1998)
Appl. Surf. Sci.
, vol.130-132
, pp. 919-924
-
-
Ohgi, T.1
Sheng, H.-Y.2
Nejoh, H.3
-
18
-
-
0034264807
-
-
(b) Wang, B.; Xiao, X.; Sheng, P. J. Vac. Sci. Technol. B 2000, 18(5), 2351-2358.
-
(2000)
J. Vac. Sci. Technol. B
, vol.18
, Issue.5
, pp. 2351-2358
-
-
Wang, B.1
Xiao, X.2
Sheng, P.3
-
19
-
-
0033584805
-
-
Chen, J.; Reed, M. A.; Rawlett, A. M.; Tour, J. M. Science 1999, 286, 1550-1552.
-
(1999)
Science
, vol.286
, pp. 1550-1552
-
-
Chen, J.1
Reed, M.A.2
Rawlett, A.M.3
Tour, J.M.4
-
21
-
-
0037014680
-
-
Loo, Y.-L.; Willett, R. L.; Baldwin, K. W.; Rogers, J. A. J. Am. Chem. Soc. 2002, 124, 7654-7655.
-
(2002)
J. Am. Chem. Soc.
, vol.124
, pp. 7654-7655
-
-
Loo, Y.-L.1
Willett, R.L.2
Baldwin, K.W.3
Rogers, J.A.4
-
24
-
-
0742319329
-
-
(c) Doeswijk, L. M.; Rijnders, G.; Blank, D. H. A. Appl. Phys. A 2004, 78, 263-268.
-
(2004)
Appl. Phys. A
, vol.78
, pp. 263-268
-
-
Doeswijk, L.M.1
Rijnders, G.2
Blank, D.H.A.3
-
25
-
-
2642569259
-
-
PhD Thesis, University of Twente, ISBN 90-365-1657-9
-
(d) Rijnders, G. PhD Thesis, University of Twente, 2001, ISBN 90-365-1657-9, p 13-18.
-
(2001)
, pp. 13-18
-
-
Rijnders, G.1
-
26
-
-
0034205553
-
-
(a) Brugger, J.; Berenschot, J. W.; Kuiper, S.; Nijdam, W.; Otter, B.; Elwenspoek, M. Microelec. Eng. 2000, 53, 403-405.
-
(2000)
Microelec. Eng.
, vol.53
, pp. 403-405
-
-
Brugger, J.1
Berenschot, J.W.2
Kuiper, S.3
Nijdam, W.4
Otter, B.5
Elwenspoek, M.6
-
27
-
-
0012827729
-
-
(b) Kolbel, M.; Tjerkstra, R. W.; Brugger, J.; van Rijn, C. J. M.; Nijdam, W.; Huskens, J.; Reinhoudt, D. N. Nano Lett. 2002, 2, 1339-1343.
-
(2002)
Nano Lett.
, vol.2
, pp. 1339-1343
-
-
Kolbel, M.1
Tjerkstra, R.W.2
Brugger, J.3
Van Rijn, C.J.M.4
Nijdam, W.5
Huskens, J.6
Reinhoudt, D.N.7
-
28
-
-
2642540849
-
-
Nanosieves (trade name is microsieve) were bought from Aquamarijn Micro Filtration B. V., Hengelo (Gld.), The Netherlands
-
(c) Nanosieves (trade name is microsieve) were bought from Aquamarijn Micro Filtration B. V., Hengelo (Gld.), The Netherlands.
-
-
-
-
29
-
-
0036400955
-
-
2/3) signal of the unbound sulfur (163.43 eV) which had equal intensities. The relatively low contact angle of 85° indicates a thiol-terminated surface. See also: (a) Chah, S.; Fendler, J. H.; Yi, J. Chem. Commun. 2002, 2094-2095. (b) Kohli, P.; Taylor, K. K.; Harris, J. J.; Blanchard, G. J. J. Am. Chem. Soc. 1998, 120, 11962-11968.
-
(2002)
Chem. Commun.
, pp. 2094-2095
-
-
Chah, S.1
Fendler, J.H.2
Yi, J.3
-
30
-
-
0032567164
-
-
2/3) signal of the unbound sulfur (163.43 eV) which had equal intensities. The relatively low contact angle of 85° indicates a thiol-terminated surface. See also: (a) Chah, S.; Fendler, J. H.; Yi, J. Chem. Commun. 2002, 2094-2095. (b) Kohli, P.; Taylor, K. K.; Harris, J. J.; Blanchard, G. J. J. Am. Chem. Soc. 1998, 120, 11962-11968.
-
(1998)
J. Am. Chem. Soc.
, vol.120
, pp. 11962-11968
-
-
Kohli, P.1
Taylor, K.K.2
Harris, J.J.3
Blanchard, G.J.4
-
31
-
-
2642513092
-
-
note
-
2 chips and rinsed in dichloromethane or cleaned by oxygen plasma treatment before preparing SAMs.
-
-
-
-
32
-
-
2642579095
-
-
note
-
XPS analyses were performed on a Quantera SXM, from Physical Electronics, equipped with monochromator. The X-ray source is Al with Kα of 1486.6 eV. The spot size is 100 μm in maximum diameter.
-
-
-
|