Evaluations and considerations for self-assembled monolayer field-effect transistors

Nano Letters

Volumn 3, Issue 2, 2003, Pages 119-124

  Kagan, C R ^a   Afzali, A ^a   Martel, R ^a   Gignac, L M ^a   Solomon, P M ^a   Schrott, A G ^a   Ek, B ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; ELECTRICITY; EQUIPMENT DESIGN; EVALUATION; MEASUREMENT; PHYSICAL CHEMISTRY; REPRODUCIBILITY; SEMICONDUCTOR; THICKNESS;

EID: 0012272966     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl0259075     Document Type: Article

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