A testability metric for path delay faults and its application

Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Volumn , Issue , 2000, Pages 593-598

  Tsai, Huan Chih ^a   Cheng, Kwang Ting ^a   Agrawal, Vishwani D ^b  

^a Santa Barbara   (United States)

^b LUCENT TECHNOLOGIES   (United States)

Author keywords

arbiter; crossbar switch; interconnection network; network router

Indexed keywords

ARBITER; CROSSBAR SWITCH; EFFICIENT COMPUTATION; NETWORK ROUTERS; PATH DELAY FAULT; PATH DELAY FAULT TESTABILITY; STRONG CORRELATION; TEST APPLICATIONS;

BUILT-IN SELF TEST; COMPUTER AIDED DESIGN; DESIGN FOR TESTABILITY; INTERCONNECTION NETWORKS;

ELECTRIC FAULT CURRENTS;

EID: 26044461787     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/368434.368820     Document Type: Conference Paper

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