Constructive multi-phase test point insertion for scan-based BIST

IEEE International Test Conference (TC)

Volumn , Issue , 1996, Pages 649-658

  Tamarapalli, Nagesh ^a   Rajski, Janusz ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FAULT CURRENTS;

CONSTRUCTIVE MULTIPHASE TEST POINT INSERTION; SCAN BASED BUILT IN SELF TEST;

INTEGRATED CIRCUIT TESTING;

EID: 0030404034     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (26)