Direct observation of single domains in poled(111) PZT (PbZr0.25Ti0.75O3) films

Surface Science

Volumn 440, Issue 1-2, 1999, Pages 221-230

  Zybill, C E ^a   Boubekeur, H ^a   Radojkovic, P ^a   Schwartzkopff, M ^a   Hartmann, E ^a   Koch, F ^a   Groos, G ^b   Rezek, B ^b   Bruchhaus, R ^c   Wersing, W ^c  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^b WALTER SCHOTTKY INSTITUT   (Germany)

^c SIEMENS AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; LEAD COMPOUNDS; MATHEMATICAL MODELS; PLATINUM; SCANNING TUNNELING MICROSCOPY; SILICA; SILICON; SURFACE STRUCTURE; SURFACE TOPOGRAPHY; X RAY SCATTERING;

FILM THICKNESS; LEAD ZIRCONATE TITANATE; SMALL ANGLE X RAY SCATTERING;

DIELECTRIC FILMS;

EID: 0033207813     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)00797-9     Document Type: Article

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