Free energy and capture cross section of the E2 trap in n-type GaN

Physica Status Solidi (A) Applications and Materials Science

Volumn 202, Issue 4, 2005, Pages 609-613

  Pernot, J ^a   Ulzhofer C ^a   Muret, P ^a   Beaumont, B ^b   Gibart, P ^b  

^a LABORATOIRE DE CRISTALLOGRAPHIE   (France)

^b CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CROSS SECTIONS; SPACE CHARGE DEPTH MODULATION; TRANSIENT SPECTROSCOPY;

ELECTRIC CHARGE; FREE ENERGY; GALLIUM NITRIDE; PULSE MODULATION; SPECTROSCOPIC ANALYSIS;

ELECTRON TRAPS;

EID: 25444435942     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200460438     Document Type: Conference Paper

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