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Volumn 53, Issue , 2003, Pages 247-255

Challenges for integration of embedded FeRAMs in the sub-180 nm regime

Author keywords

3D structures; FeCaps; FeRAMs; Ferroelectrics; SBT

Indexed keywords

CAPACITORS; FERROELECTRICITY; IRON COMPOUNDS; MICROSTRUCTURE; NONVOLATILE STORAGE;

EID: 17444386786     PISSN: 10584587     EISSN: 16078489     Source Type: Conference Proceeding    
DOI: 10.1080/10584580390258165     Document Type: Article
Times cited : (15)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.