Nanosphere lithography: effect of substrate on the localized surface plasmon resonance spectrum of silver nanoparticles

Journal of Physical Chemistry B

Volumn 105, Issue 12, 2001, Pages 2343-2350

  Malinsky, Michelle Duval ^a   Lance Kelly, K ^a   Schatz, George C ^a   van Duyne, Richard P ^a  

^a NORTHWESTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DISCRETE DIPOLE APPROXIMATION; LOCALIZED SURFACE PLASMON RESONANCE SPECTRUM; NANOSTRUCTURED LITHOGRAPHY; SUBSTRATE EFFECTS;

APPROXIMATION THEORY; ATOMIC FORCE MICROSCOPY; FUSED SILICA; NANOTECHNOLOGY; OPTICAL GLASS; PARTICLE SIZE ANALYSIS; REFRACTIVE INDEX; SENSITIVITY ANALYSIS; SILVER; ULTRAVIOLET SPECTROSCOPY;

NANOSTRUCTURED MATERIALS;

EID: 0035967344     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp002906x     Document Type: Article

References (39)

1. Kreibig, U.; Vollmer, M. Optical Properties of Metal Clusters; Springer-Verlag: Heidelberg, Germany, 1995; Vol. 25.
2. Campion, A.; Kambhampati, P. Chem. Soc. Rev. 1998, 27, 241-250.
3. Hilger, A.; Cuppers, N.; Tenfelde, M.; Kreibig, U. Ear. Phys. J. D 2000,70, 115-118.
4. Dirix, Y.; Bastiaansen, C.; Caseri, W.; Smith, P. Adv. Mater. 1999, 11, 223-227.
5. Kroschwitz, J. I.; Howe-Grant, M. Glass. In Encyclopedia of Chemical Technology, 4th ed.; Kroschwitz, J. I., Howe-Grant, M., Eds.; John Wiley & Sons: New York, 1994; Vol. 12, pp 569-571.
6. Quinten, M.; Leitner, A.; Krenn, J. R.; Aussenegg, F. R. Opt. Lett. 1998, 23, 1331-1333.
7. Krenn, J. R.; Dereux, A.; Weeber, J. C.; Bourillot, E.; Lacroute, . Y.; Goudonnet, J. P. Phys. Rev. Lett. 1999, 82, 2590-2593.
8. Ebbesen, T. W.; Lezec, H. J.; Ghaemi, H. F.; Thio, T.; Wolff, P. A. Nature 1998, 597, 667-669.
9. Pendry, J. B. Science 1999, 285, 1687-1688.
10. Sdnchez, E. J.; Novotny, L.; Xie, X. S. Phys. Rev. Lett. 1999, 82, 4014-4017.
11. Knoll, B.; Kellmann, F. Nature 1999, 399, 134-137.
12. Hamann, H. F.; Gallagher, A.; Nesbitt, D. J. Appl. Phys. Lett. 1998, 73, 1469-1471.
13. Novotny, L.; Bian, R. X.; Xie, S. Phys. Rev. Lett. 1997, 79, 645-648.
14. Pufall, M. R.; Berger, A.; Schultz, S. J. Appl. Phys. 1997,57,5689-5691.
15. Jensen, T. R.; Van Duyne, R. P.; Johnson, S. A.; Maroni, V. A. Appl. Spectrosc. 2000, 54, 371 -377.
16. Wadayama, T.; Suzuki, O.; Takeuchi, K.; Seki, H.; Tanabe, T.; Suzuki, Y.; Hatta, A. Appl. Phys. A 1999, 69, 77-80.
17. Tarcha, P. J.; DeSaja-Gonzalez, J.; Rodriguez-Llorente, S.; Aroca, R. Appl. Spectrosc. 1999, 53, 43-48.
18. Emory, S. R.; Nie, S. J. Phys. Chem. B 1998, 702, 493-497.
19. Nie, S.; Emory, S. R. Science 1997, 275, 1102-1106.
20. Yang, W. H.; Hulteen, J. C.; Schatz, G. C.; Van Duyne, R. P. J. Chem. Phys. 1996, 104, 4313-4323.
21. Freeman, R. G.; Grabar, K. C.; Allison, K. J.; Bright, R. M.; Davis, J. A.; Guthrie, A. P.; Hommer, M. B.; Jackson, M. A.; Smith, P. C.; Walter, D. G.; Natan, M. J. Science 1995, 267, 1629-1632.
22. Pipino, A. C. R.; Schatz, G. C.; Van Duyne, R. P. Phys. Rev. B 1996, 53, 4162-4169.
23. Van Duyne, R. P.; Hulteen, J. C.; Treichel, D. A. J. Chem. Phys. 1993,99,2101-2115.
24. Bauer, G.; Pittner, F.; Schalkhammer, T. Mikrochim. Acta 1999, 737,107-114.
25. Storhoff, J. J.; Elghanian, R.; Mucic, R. C.; Mirkin, C. A.; Letsinger, R. L. J. Am. Chem. Soc. 1998, 720, 1959-1964.
26. Elghanian, R.; Storhoff, J. J.; Mucic, R. C.; Letsinger, R. L.; Mirkin, C. A. Science 1997, 277, 1078-1081.
27. Kreibig, U.; Gartz, M.; Hilger, A. Ber. Bunsen-Ges. Phys. Chem. 1997, 707, 1593-1604.
28. Hulteen, J. C.; Van Duyne, R. P. J. Vac. Sei. Technol, A 1995,13, 1553-1558.
29. Hulteen, J. C.; Treichel, D. A.; Smith, M. T.; Duval, M. L.; Jensen, T. R.; Van Duyne, R. P. J. Phys. Chem. B 1999, 703, 3854-3863.
30. Jensen, T. R.; Schatz, G. C.; Van Duyne, R. P. J. Phys. Chem. B 1999, 703, 2394-2401.
31. Jensen, T. R.; Duval, M. L.; Kelly, L.; Lazarides, A.; Schatz, G. C.; Van Duyne, R. P. J. Phys. Chem. B 1999, 703, 9846-9853.
32. Jensen, T. R.; Duval Malinsky, M.; Haynes, C. L.; Van Duyne, R. P. J. Ph\s. Chem. B 2000, 104, 10549-10556.
33. Duval Malinsky, M.; Kelly, L.; Schatz, G. C; Van Duyne, R. P. J. Am. Chem. Soc. 2001, in press.
34. Jensen, T. R.; Kelly, L.; Lazarides, A.; Schatz, G. C. J. Cliist. Sei. 1999, 10, 295-317.
35. Draine, B. T.; Flatau, P. J. J. Opt. Soc. Am. A 1994, 11, 1491.
36. Yans, W. H.; Schatz, G. C.; Van Duyne, R. P. J. Chem. Pliys. 1995, 103, 869-875.
37. Draine, B. T.; Flatau, P. J. Program DDSCAT; University of California, San Diego, Scripps Institute of Oceanography, 8605 La Jolla Dr., La Jolla, CA 92093-0221.
38. Palik, E. D. Handbook of Optical Constants of Solids; Academic Press, Inc.: New York, 1985.
39. Wismann, P. Optical Properties of Thin Metal Films Interacting with Gases. In Handbook of Optical Properties. Optics of Small Particles, Interfaces, and Surfaces; Hummel, R. E. W. P., Ed.; CRC Press: Boca Raton, FL, 1997; Vol. II, pp 401-446.