Towards nanotomography with asymmetrically cut crystals

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 551, Issue 1, 2005, Pages 119-124

  Stampanoni, Marco ^a   Borchert, Gunther ^b   Abela, R ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

Asymmetric Bragg diffraction; Synchrotron microtomography; X ray imaging

Indexed keywords

CHARGE COUPLED DEVICES; CRYSTALS; DIFFRACTION; IMAGING TECHNIQUES; MICROMETERS; PHOSPHORS; TOMOGRAPHY;

ASYMMETRIC BRAGG DIFFRACTION; SYNCHROTRON MICROTOMOGRAPHY; X-RAY IMAGING;

NANOTECHNOLOGY;

EID: 24944441227     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2005.07.046     Document Type: Conference Paper

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