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Physical Review Letters

Volumn 86, Issue 14, 2001, Pages 3044-3047

Submicrometer resolution hard x-ray holography with the asymmetric Bragg diffraction microscope

(1) Spal, R D a

a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE REFLECTION; HOLOGRAPHY; IMAGING SYSTEMS; OPTICAL TRANSFER FUNCTION; X RAY RADIOGRAPHY;

HARD X RAY HOLOGRAPHY; X RAY MICROTOMOGRAPHY;

DIFFRACTIVE OPTICS;

EID: 0035794682 PISSN: 00319007 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevLett.86.3044 Document Type: Article

Times cited : (32)

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