Two-dimensional asymmetrical Bragg diffraction for submicrometer computer tomography

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5195, Issue , 2003, Pages 54-62

  Stampanoni, Marco ^a   Borchert, Gunther ^b   Abela, R ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

Asymmetric diffraction; Microtomography; X ray imaging

Indexed keywords

BRAGG CELLS; COHERENT LIGHT; CRYSTALS; DIFFRACTION; SILICON; SYNCHROTRON RADIATION; X RAY OPTICS;

ASYMMETRIC DIFFRACTION; MICROTOMOGRAPHY; X RAY IMAGING;

COMPUTERIZED TOMOGRAPHY;

EID: 1842426645     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.503825     Document Type: Conference Paper

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