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Volumn 5751, Issue II, 2005, Pages 927-934

High-power and high-repetition-rate EUV source based on Xe discharge-produced plasma

Author keywords

Capillary; DPP; EUV source; Lithography; Pulsed power; Z pinch

Indexed keywords

CAPILLARY FLOW; COOLING; INDUCTANCE; LITHOGRAPHY; PINCH EFFECT; ULTRAVIOLET RADIATION; XENON;

EID: 24644467682     PISSN: 16057422     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.602021     Document Type: Conference Paper
Times cited : (4)

References (9)
  • 4
    • 3743122911 scopus 로고    scopus 로고
    • Intense xenon capillary discharge extreme-ultraviolet source in the 10-16-nm-wavelength region
    • October
    • M. A. Klosner, W. T. Silfvast, "Intense Xenon Capillary Discharge Extreme-Ultraviolet Source in the 10-16-nm-wavelength region," Optics Letters, Vol. 23, No. 20, pp. 1609-1611, October 1998
    • (1998) Optics Letters , vol.23 , Issue.20 , pp. 1609-1611
    • Klosner, M.A.1    Silfvast, W.T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.