Modeling skin and proximity effects with reduced realizable RL circuits

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 12, Issue 4, 2004, Pages 437-447

  Mei, Shizhong ^a   Ismail, Yehea I ^a  

^a Northwestern University   (United States)

Author keywords

Proximity effect; RLC; Simulation; Skin effect

Indexed keywords

COMPUTER SIMULATION; ELECTRIC POWER DISTRIBUTION; ELECTRIC RESISTANCE; ELECTRIC WIRE; INDUCTANCE; MATHEMATICAL MODELS; VLSI CIRCUITS;

FREQUENCY DEPENDENT RESISTANCE; PROXIMITY EFFECT; PROXIMITY EFFECTS; RLC;

MICROPROCESSOR CHIPS;

EID: 2442700662     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2004.825863     Document Type: Conference Paper

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