Generating reduced order models via PEEC for capturing skin and proximity effects

IEEE Topical Meeting on Electrical Performance of Electronic Packaging

Volumn , Issue , 1997, Pages 259-262

  Kamon, Mattan ^a   Marques, Nuno ^a   Silveira, L Miguel ^a   White, Jacob ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; MATHEMATICAL MODELS; MATRIX ALGEBRA; SKIN EFFECT;

PARTIAL ELEMENT EQUIVALENT CIRCUIT (PEEC) TECHNIQUE; PROXIMITY EFFECTS;

EQUIVALENT CIRCUITS;

EID: 0031335538     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)