Using conduction modes basis functions for efficient electromagnetic analysis of on-chip and off-chip interconnect

Proceedings - Design Automation Conference

Volumn , Issue , 2001, Pages 563-566

  Daniel, Luca ^a   Sangiovanni Vincentelli, Aberto ^a   White, Jacob ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; ELECTRIC CONDUCTORS; ELECTRIC CURRENT DISTRIBUTION; ELECTRIC LINES; INTEGRAL EQUATIONS; RESONANCE; SIGNAL INTERFERENCE; SKIN EFFECT;

MIXED POTENTIAL INTEGRAL EQUATIONS (MPIE); TRANSMISSION LINE RESONANCES;

INTERCONNECTION NETWORKS;

EID: 0034840755     PISSN: 0738100X     EISSN: None     Source Type: Journal    
DOI: 10.1109/DAC.2001.156203     Document Type: Article

References (9)

1. Fastcap: A multipole accelerated 3-D capacitance extraction program
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4. Fasthenry: A multipole-accelerated 3-D inductance extraction program
5. Interconnect series impedance determination using a surface ribbon method
6. Enhanced skin effect for partial-element equivalent-circuit (PEEC) models
7. A wide frequency range surface integral formulation for 3-D RLC extraction
8. Equivalent circuit models for three dimensional multiconductor systems
9. Surface impedance near edges and corners in three-dimensional media