Enhanced skin effect for partial-element equivalent-circuit (PEEC) models

IEEE Transactions on Microwave Theory and Techniques

Volumn 48, Issue 9, 2000, Pages 1435-1442

  Coperich, Karen M ^a   Ruehli, Albert E ^a   Cangellaris, Andreas ^b  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC IMPEDANCE; ELECTRIC LINES; ELECTRIC RESISTANCE; EQUIVALENT CIRCUITS; FINITE DIFFERENCE METHOD; INTEGRAL EQUATIONS; MATHEMATICAL MODELS; SKIN EFFECT;

PARTIAL-ELEMENT EQUIVALENT-CIRCUIT (PEEC) MODELS; PROXIMITY EFFECT; VOLUME FILAMENT TECHNIQUE;

MICROWAVE INTEGRATED CIRCUITS;

EID: 0034270898     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.868992     Document Type: Article

References (9)

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