Solvent-Induced Self-Assembly of Mixed Poly(methyl methacrylate)/Polystyrene Brushes on Planar Silica Substrates: Molecular Weight Effect

Journal of the American Chemical Society

Volumn 126, Issue 19, 2004, Pages 6124-6134

  Zhao, Bin ^a   Haasch, Richard T ^b   MacLaren, Scott ^b  

^a UNIVERSITY OF TENNESSEE   (United States)

^b United States of America   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACETIC ACID; ATOMIC FORCE MICROSCOPY; CONTACT ANGLE; MOLECULAR WEIGHT; MORPHOLOGY; POLYSTYRENES; SELF ASSEMBLY; SILICA; SILICON WAFERS; SOLVENTS; X RAY PHOTOELECTRON SPECTROSCOPY;

MIXED BRUSHES; SELF-REORGANIZATION;

POLYMETHYL METHACRYLATES;

ACETIC ACID; CYCLOHEXANE; POLY(METHYL METHACRYLATE); POLYMER; POLYSTYRENE; SILICON; SOLVENT;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL STRUCTURE; MICELLE; MOLECULAR WEIGHT; PHASE TRANSITION; SURFACE PROPERTY;

EID: 2442588834     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja049570f     Document Type: Article

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