SrTiO3(110) thin films grown directly on different oriented silicon substrates

Applied Physics A: Materials Science and Processing

Volumn 81, Issue 6, 2005, Pages 1233-1236

  Hao, J H ^a   Gao, J ^a   Wong, H K ^b  

^a UNIVERSITY OF HONG KONG   (Hong Kong)

^b CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; EPITAXIAL GROWTH; PEROVSKITE; PULSED LASER DEPOSITION; SILICON; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

BUFFER LAYERS; IN-PLANE ALIGNMENTS; LAUE DIFFRACTION; ROCKING CURVE;

STRONTIUM COMPOUNDS;

EID: 24144469104     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00339-005-3303-4     Document Type: Article

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