Modeling of statistical low-frequency noise of deep-submicrometer MOSFETs

IEEE Transactions on Electron Devices

Volumn 52, Issue 7, 2005, Pages 1576-1588

  Wirth, Gilson I ^a,b   Koh, Jeongwook ^c,d   da Silva, Roberto ^a   Thewes, Roland ^c   Brederlow, Ralf ^c  

^a FEDERAL UNIVERSITY OF RIO GRANDE DO SUL   (Brazil)

^b UNIVERSIDADE ESTADUAL DO RIO GRANDE DO SUL   (Brazil)

^c INFINEON TECHNOLOGIES AG   (Germany)

^d SAMSUNG Electronics   (South Korea)

Author keywords

Analog circuits; Low frequency noise (LF noise); MOS transistors; Noise modeling; RF circuits; Semiconductor device noise

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; MATHEMATICAL MODELS; POISSON DISTRIBUTION; SPURIOUS SIGNAL NOISE; STATISTICAL METHODS;

ANALOG CIRCUITS; LOW FREQUENCY NOISE; NOISE MODELING; RF CIRCUITS; SEMICONDUCTOR DEVICE NOISE;

MOSFET DEVICES;

EID: 23944493427     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2005.850955     Document Type: Article

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