Combined fault classification and error propagation analysis to refine RT-level dependability evaluation

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 21, Issue 4, 2005, Pages 365-376

  Ammari, Abdelaziz ^a,b   Hadjiat, Karim ^a,b   Leveugle, Régis ^a  

^a TIMA LABORATORY   (France)

^b GRENOBLE INSTITUTE OF TECHNOLOGY   (France)

Author keywords

Dependability analysis; Digital circuits; Fault injection; RT level VHDL 8051; VLSI design

Indexed keywords

ELECTRIC FAULT CURRENTS; ERROR ANALYSIS; MICROCONTROLLERS; PROGRAM PROCESSORS; VLSI CIRCUITS;

DEPENDABILITY ANALYSIS; FAULT INJECTION; VLSI DESIGN;

DIGITAL CIRCUITS;

EID: 23944485449     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10836-005-0974-x     Document Type: Conference Paper

References (10)

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6. http://www.8051.free.fr/
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