Increased ordering in the amorphous SiO x due to hyperthermal atomic oxygen

Materials Research Society Symposium Proceedings

Volumn 851, Issue , 2005, Pages 419-424

  Kisa, Maja ^a   Stratton, William G ^b   Minton, Timothy K ^c   Van Benthem, Klaus ^d   Pennycook, Steve J ^d   Voyles, Paul M ^b   Chen, Xidong ^e,f   Li, Long ^a   Yang, Judith C ^a  

^a University of Pittsburgh   (United States)

^b UNIVERSITY OF WISCONSIN MADISON   (United States)

^c MONTANA STATE UNIVERSITY   (United States)

^d OAK RIDGE NATIONAL LABORATORY   (United States)

^e CEDARVILLE UNIVERSITY   (United States)

^f ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS OXIDES; ELECTRON ENERGY LOSS SPECTROSCOPY (EELS); MOLECULAR OXYGEN (MO); SELECTED AREA ELECTRON DIFFRACTION (SAED);

AMORPHOUS MATERIALS; ELECTRON DIFFRACTION; FUNCTIONS; INTERFACES (MATERIALS); LASER APPLICATIONS; OXIDATION; TRANSMISSION ELECTRON MICROSCOPY;

SILICA;

EID: 23844555291     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (25)

1. T. K. Minton and D. J. Garton, Chemical Dynamics in Extreme Environments: Advanced Series in Physical Chemistry - Vol. 11, Edited by R. Dressler (World Scientific, Singapore, 2001), 420-489.
2. A.R. Chambers, I.L. Harris and G.T. Roberts, Materials Letters 26, 121 -131 (1996).
3. th TMS Annual Meeting and Exhibit, Anaheim, February 18-22 (1990).
4. B. Banks, S. Rutledge, K. de Groh and B. Auer, NATO advanced study institute conference Pitlochry, Scotland, July 7-19 (1991).
5. M. Randjelovic and J. C. Yang, Materials at High Temperatures, 20(3), 281-285 (2003).
6. G.E. Caledonia, R.H. Krech and B.D. Green, AIAA J, 25, 59-63 (1987).
7. D.B. Oakes, R.H. Krech, B.L. Upschuete and G.E. Caledonia, J.Appl.Phys.77, 2166-2172 (1995).
8. M.M.J. Treacy and J.M. Gibson, Acte Cryst. A, 52(2): 212-220. (1996).
9. M. Kisa, T. K. Minton, and J. C. Yang, J Appl. Phys., accepted to be published in January 2005.
10. M. Kisa, R. D. Twesten and J. C. Yang, Mat. Res. Symp. Proc. 786, 267-272 (2004).
11. L.A.J. Garvie and P.R. Buseck, American Mineralogist, 84, 946-964, (1999).
12. PCPDF files
13. M. Tagawa, T. Erna, H. Kinoshita, N. Ohraae, M. Umeno, and T. K. Minton, Jpn. J. Appl. Phys. 37, L1455-L1457(1998).
14. S. R. Elliot "Physics of Amorphous Materials", Longman (1983).
15. P.M. Voyles, J.M. Gibson, and M.M.J. Treacy, J. Electron Microsc.49, 259-266. (2000).
16. P.M. Voyles and J.R. Abelson, National Renewable Energy Laboratory-Final Report, October 2003.
17. M. Tagawa, K. Yokota, N. Ohmae and H. Kinoshita, High Perform. Polym.12, 53-63 (2000).
18. M. Tagawa, K.Yokota, N. Ohmae, H. Kinoshita and M. Umeno, Jpn J.Appl.Phys, 40, 6152-6156 (2001).
19. J.R. Engstrom, M.M. Nelson and T. Engel, J. Vac. Sci. Technol. A7(3), 1837-1840 (1989).
20. J.R. Engstrom and T. Engel, Phys. Rev. B, 41(2), 1038-1042 (1990).
21. E. Irene, Appl. Phys. Lett. 51(10), 767-769 (1987).
22. S. Ichimura, A. Kurokawa, K. Nakamura, H. Itoh, H. Nonaka and K. Koike, Thin Solid Films, 377-378, 518-524(2000).
23. H. Itoh, K. Nakamura, A. Kurokawa and S. Ichimura, Surface Science, 482-485, 114-120 (2001).
24. H. Watanabe, K. Kato, T. Uda, K. Fujita and M. Ichikawa, Phys. Rev. Lett, 80, 345 (1998).
25. A. Kuznetsova, G. Zhou, X. Chen, J. Yang, and J. T. Yates Jr., Langmuir 17, 2146 (2001)